Logo

SAE J784A (AUG1971)

Current Revision

Residual Stress Measurement by X-Ray Diffraction

$167.00

$167.00

$300.60


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


Document Preview Not Available...

No scope available

SDO SAE: SAE International
Document Number J784A
Publication Date Aug. 1, 1971
Language en - English
Page Count 124
Revision Level 197108
Supercedes
Committee
Publish Date Document Id Type View
Aug. 1, 1971 J784A_197108 Revision