Logo

JIS R 1636:1998

Current Revision

Test method for thickness of fine ceramic thin films -- Film thickness by contact probe profilometer

$32.00

$32.00

$64.00


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


Document Preview Not Available...

No overview provided by publisher

SDO JIS: Japanese Standards Association
Document Number JIS R 1636
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Not Available JIS R 1636:1998 Revision