JIS |
JIS C 5402-1-2 |
Connectors for electronic equipment -- Tests and measurements -- Part 1-2: General examination -- Test 1b: Examination of dimension and mass |
|
IEC |
IEC 60512-1-2 |
Connectors for electronic equipment - Tests and measurements - Part 1-2: General examination - Test 1b: Examination of dimension and mass |
|
BSI |
BS EN 60512-1-2 |
Connectors for electronic equipment. Tests and measurements. General. Test 1b. Examination of dimension and mass |
|
JIS |
JIS C 5402-1-1 |
Connectors for electronic equipment -- Tests and measurements -- Part 1-1: General examination -- Test 1a: Visual examination |
|
IEC |
IEC 60512-1-1 |
Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination |
|
BSI |
BS EN 60512-1-1 |
Connectors for electronic equipment. Tests and measurements. General. Test 1a. Visual examination |
|
IEC |
IEC 60512-1 |
Connectors for electrical and electronic equipment - Tests and measurements - Part 1: Generic specification |
|
IEC |
IEC 60512-1-100 |
Connectors for electronic equipment - Tests and measurements - Part 1-100: General - Applicable publications |
|
BSI |
BS EN 60512-1-100 |
Connectors for electronic equipment. Tests and measurements. General. Applicable publications |
|
BSI |
BS EN IEC 60512-1 |
Connectors for electrical and electronic equipment. Tests and measurements. Generic specification |
|
IEC |
IEC 60512-25-4 |
Connectors for electronic equipment - Tests and measurements - Part 25-4: Test 25d - Propagation delay |
|
IEC |
IEC 60512-9-1 |
Connectors for electronic equipment - Tests and measurements - Part 9-1: Endurance tests - Test 9a: Mechanical operation |
|
IEC |
IEC 60512-25-1 |
Connectors for electronic equipment - Tests and measurements - Part 25-1: Test 25a - Crosstalk ratio |
|
IEC |
IEC 60512-25-3 |
Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c - Rise time degradation |
|
IEC |
IEC 60512-25-2 |
Connectors for electronic equipment - Tests and measurements - Part 25-2: Test 25b - Attenuation (insertion loss) |
|
IEC |
IEC 60512-22-1 |
Connectors for electronic equipment - Tests and measurements - Part 22-1: Capacitance tests - Test 22a: Capacitance |
|
IEC |
IEC 60512-16-6 |
Connectors for electronic equipment - Tests and measurements - Part 16-6: Mechanical tests on contacts and terminations - Test 16f: Robustness of terminations |
|
BSI |
BS EN 60512-1-3 |
Connectors for electronic equipment. Tests and measurements. General. Test 1c. Electrical engagement length |
|
IEC |
IEC 60512-6-2 |
Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump |
|
JIS |
JIS C 5402-6-2 |
Connectors for electronic equipment -- Tests and measurements -- Part 6-2: Dynamic stress tests -- Test 6b: Bump |
|
IEC |
IEC 60512-3-1 |
Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests - Test 3a: Insulation resistance |
|
JIS |
JIS C 5402-3-1 |
Connectors for electronic equipment -- Tests and measurements -- Part 3-1: Insulation tests -- Test 3a: Insulation resistance |
|
IEC |
IEC 60512-16-1 |
Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage |
|
JIS |
JIS C 5402-11-10 |
Connectors for electronic equipment -- Tests and measurements -- Part 11-10: Climatic tests -- Test 11j: Cold |
|
IEC |
IEC 60512-11-10 |
Connectors for electronic equipment - Tests and measurements - Part 11-10: Climatic tests - Test 11j: Cold |
|
IEC |
IEC 60512-6-1 |
Connectors for electronic equipment - Tests and measurements - Part 6-1: Dynamic stress tests - Test 6a: Acceleration, steady state |
|
JIS |
JIS C 5402-6-1 |
Connectors for electronic equipment -- Tests and measurements -- Part 6-1: Dynamic stress tests -- Test 6a: Acceleration, steady state |
|
IEC |
IEC 60512-16-18 |
Connectors for electronic equipment - Tests and measurements - Part 16-18: Mechanical tests on contacts and terminations - Test 16r: Deflection of contacts, simulation |
|
BSI |
BS EN 60512-25-4 |
Connectors for electronic equipment. Test and measurements. Test 25d. Propagation delay |
|
IEC |
IEC 60512-25-5 |
Connectors for electronic equipment - Tests and measurements - Part 25-5: Test 25e - Return loss |
|
IEC |
IEC 60512-16-2 |
Connectors for electronic equipment - Tests and measurements - Part 16-2: Mechanical tests on contacts and terminations - Test 16b: Restricted entry |
|
IEC |
IEC 60512-1-101 |
Connectors for electronic equipment - Tests and measurements - Part 1-101: Blank detail specification |
|
IEC |
IEC 60512-11-9 |
Connectors for electronic equipment - Tests and measurements - Part 11-9: Climatic tests - Test 11i: Dry heat |
|
JIS |
JIS C 5402-11-9 |
Connectors for electronic equipment -- Tests and measurements -- Part 11-9: Climatic tests -- Test 11i: Dry heat |
|
IEC |
IEC 60512-11-1 |
Connectors for electrical and electronic equipment - Tests and measurements - Part 11-1: Climatic tests - Test 11a - Climatic sequence |
|
IEC |
IEC 60512-4-1 |
Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests - Test 4a: Voltage proof |
|
IEC |
IEC 60512-8-2 |
Connectors for electronic equipment - Tests and measurements - Part 8-2: Static load tests (fixed connectors) - Test 8b: Static load, axial |
|
JIS |
JIS C 5402-11-6 |
Connectors for electronic equipment -- Tests and measurements -- Part 11-6: Climatic tests -- Test 11f: Corrosion, salt mist |
|
IEC |
IEC 60512-11-6 |
Connectors for electronic equipment - Tests and measurements - Part 11-6: Climatic tests - Test 11f: Corrosion, salt mist |
|
BSI |
BS EN 60512-16-6 |
Connectors for electronic equipment. Tests and measurements. Mechanical tests on contacts and terminations. Test 16f. Robustness of terminations |
|
IEC |
IEC 60512-13-1 |
Connectors for electronic equipment - Tests and measurements - Part 13-1: Mechanical operation tests - Test 13a: Engaging and separating forces |
|
BSI |
BS EN 60512-25-3 |
Connectors for electronic equipment. Test and measurements. Test 25c. Rise time degradation |
|
JIS |
JIS C 5402-6-3 |
Connectors for electronic equipment -- Tests and measurements -- Part 6-3: Dynamic stress tests -- Test 6c: Shock |
|
IEC |
IEC 60512-6-3 |
Connectors for electronic equipment - Tests and measurements - Part 6-3: Dynamic stress tests - Test 6c: Shock |
|
IEC |
IEC 60512-21-1 |
Connectors for electronic equipment - Tests and measurements - Part 21-1: RF resistance tests - Test 21a: RF shunt resistance |
|
JIS |
JIS C 5402-4-2 |
Connectors for electronic equipment -- Tests and measurements -- Part 4-2: Voltage stress tests -- Test 4b: Partial discharge |
|
IEC |
IEC 60512-4-2 |
Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests - Test 4b: Partial discharge |
|
JIS |
JIS C 5402-6-4 |
Connectors for electronic equipment -- Tests and measurements -- Part 6-4: Dynamic stress tests -- Test 6d: Vibration (sinusoidal) |
|
IEC |
IEC 60512-6-4 |
Connectors for electronic equipment - Tests and measurements - Part 6-4: Dynamic stress tests - Test 6d: Vibration (sinusoidal) |
|
IEC |
IEC 60512-13-2 |
Connectors for electronic equipment - Tests and measurements - Part 13-2: Mechanical operation tests - Test 13b: Insertion and withdrawal forces |
|
SAE |
SAE TS339 |
TS339 Test for Electrical Connectors Examination of Dimensions and Mass |
|
JIS |
JIS C 5402-11-5 |
Connectors for electronic equipment -- Tests and measurements -- Part 11-5: Climatic tests -- Test 11e: Mould growth |
|
IEC |
IEC 60512-11-5 |
Connectors for electronic equipment - Tests and measurements - Part 11-5: Climatic tests - Test 11e: Mould growth |
|
IEC |
IEC 60512-15-1 |
Connectors for electronic equipment - Tests and measurements - Part 15-1: Connector tests (mechanical) - Test 15a: Contact retention in insert |
|
BSI |
BS EN 60512-16-18 |
Connectors for electronic equipment. Tests and measurements. Mechanical tests on contacts and terminations. Test 16r. Deflection of contacts, simulation |
|
IEC |
IEC 60512-16-7 |
Connectors for electronic equipment - Tests and measurements - Part 16-7: Mechanical tests on contacts and terminations - Test 16g: Measurement of contact deformation after crimping |
|
BSI |
BS EN 60512-11-10 |
Connectors for electronic equipment. Tests and measurements. Climatic tests. Test 11j. Cold |
|
IEC |
IEC 60512-25-6 |
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter |
|
BSI |
BS EN 60512-16-1 |
Connectors for electronic equipment. Tests and measurements. Mechanical tests on contacts and terminations. Test 16a. Probe damage |
|
BSI |
BS EN 60512-10-4 |
Connectors for electronic equipment. Tests and measurements. Test 10d. Electrical overload (connectors) |
|
BSI |
BS EN 60512-25-2 |
Connectors for electronic equipment. Tests and measurements. Test 25b. Attenuation (insertion loss) |
|
IEC |
IEC 60512-11-11 |
Connectors for electronic equipment - Tests and measurements - Part 11-11: Climatic tests - Test 11k: Low air pressure |
|
JIS |
JIS C 5402-11-11 |
Connectors for electronic equipment -- Tests and measurements -- Part 11-11: Climatic tests -- Test 11k: Low air pressure |
|
BSI |
BS EN 60512-9-1 |
Connectors for electronic equipment. Tests and measurements. Endurance tests. Test 9a. Mechanical operation |
|
IEC |
IEC 60512-11-12 |
Connectors for electronic equipment - Tests and measurements - Part 11-12: Climatic tests - Test 11m: Damp heat, cyclic |
|
JIS |
JIS C 5402-11-12 |
Connectors for electronic equipment -- Tests and measurements -- Part 11-12: Climatic tests -- Test 11m: Damp heat, cyclic |
|
BSI |
BS EN 60512-14-4 |
Connectors for electronic equipment. Tests and measurements. Sealing tests |
|
BSI |
BS EN 60512-14-5 |
Connectors for electronic equipment. Tests and measurements. Sealing tests |
|
BSI |
BS EN 60512-14-6 |
Connectors for electronic equipment. Tests and measurements. Sealing tests |
|
BSI |
BS EN 60512-14-2 |
Connectors for electronic equipment. Tests and measurements. Sealing tests |
|
BSI |
BS EN 60512-25-5 |
Connectors for electronic equipment. Tests and measurements. Test 25e. Return loss |
|
JIS |
JIS C 5402-11-4 |
Connectors for electronic equipment -- Tests and measurements -- Part 11-4: Climatic tests -- Test 11d: Rapid change of temperature |
|
IEC |
IEC 60512-11-7 |
Connectors for electronic equipment - Tests and measurements - Part 11-7: Climatic tests - Test 11g: Flowing mixed gas corrosion test |
|
IEC |
IEC 60512-11-4 |
Connectors for electronic equipment - Tests and measurements - Part 11-4: Climatic tests - Test 11d: Rapid change of temperature |
|
JIS |
JIS C 5402-11-7 |
Connectors for electronic equipment -- Tests and measurements -- Part 11-7: Climatic tests -- Test 11g: Flowing mixed gas corrosion test |
|