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ISO 23833:2013

Current Revision

Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary

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ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.

ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.


SDO ISO: International Organization for Standardization
Document Number ISO 23833
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 202/SC 1
Publish Date Document Id Type View
Not Available ISO 23833:2013 Revision