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ISO 22493:2014

Current Revision

Microbeam analysis - Scanning electron microscopy - Vocabulary

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ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.

ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.


SDO ISO: International Organization for Standardization
Document Number ISO 22493
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 202/SC 1
Publish Date Document Id Type View
Not Available ISO 22493:2014 Revision