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ISO 19214:2024

Current Revision

Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy

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This document gives a method for determination of the apparent growth direction of nanocrystals by transmission electron microscopy. This method is applicable to all kinds of wire-like crystalline materials synthetized by various methods. This document can also guide in determining an axis direction of the second-phase particles in steels, alloys, or other materials. The applicable diameter or width of the crystals to be tested is in the range of tens to one hundred nanometres, depending on the accelerating voltage of the transmission electron microscope (TEM) and the material itself. Position, which is curved, twisted, and folded, to determine the apparent growth direction, should not be used.


SDO ISO: International Organization for Standardization
Document Number ISO 19214
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 202/SC 3
Publish Date Document Id Type View
Not Available ISO 19214:2024 Revision
Not Available ISO 19214:2017 Revision