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ISO 16243:2011

Current Revision

Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

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ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‑ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.


SDO ISO: International Organization for Standardization
Document Number ISO 16243
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 201/SC 2
Publish Date Document Id Type View
Not Available ISO 16243:2011 Revision