Logo

ISO 15932:2013

Current Revision

Microbeam analysis - Analytical electron microscopy - Vocabulary

$166.00

$166.00

$282.20


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


Document Preview Not Available...

ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.


SDO ISO: International Organization for Standardization
Document Number ISO 15932
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 202/SC 1
Publish Date Document Id Type View
Not Available ISO 15932:2013 Revision