Logo

IEEE/ISO/IEC 13210-1994

Current Revision

ISO/IEC/IEEE International standard for Information Technology--Test Methods for Measuring Conformance to POSIX(TM)

$194.00


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


Stay effortlessly up-to-date with the latest standard revisions. When new versions are released, they're automatically charged and delivered to you, ensuring seamless compliance.

Document Preview Not Available...

- Superseded. The general requirements and test methods for measuring conformance to POSIX standards are defined. This document is aimed primarily at working groups developing test methods for POSIX standards, developers of POSIX test methods, and users of POSIX test methods.
This International Standard is applicable to the development and use of conformance testing methodologies for POSIX standards. The generic test methods identified in this International Standard shall be used in conjunction with test methods identified for a specific standard. This International Standard is intended for use by working groups developing test methods for POSIX standards, developers of POSIX test methods, and users of POSIX test methods. The purpose of this International Standard is to deÞne general rules for developing test assertions and related test methods for measuring conformance of an implementation to POSIX standards. Test methods may include POSIX Conformance Test Suites (PCTS), POSIX Conformance Test Procedures (PCTP), and audits of POSIX Conformance Documents (PCD). Testing conformance of an implementation to a standard includes testing the claimed capabilities and behavior of the implementation with respect to the conformance requirements of the standard. Test methods are intended to provide a reasonable, practical assurance that the implementation conforms to the standard. Use of these test methods will not guarantee conformance of an implementation to the standard; that normally would require exhaustive testing (see 4.2.1), which is impractical for both technical and economic reasons.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 13210
Publication Date Dec. 30, 1994
Language en - English
Page Count 64
Revision Level
Supercedes
Committee Portable Applications
Publish Date Document Id Type View
Dec. 30, 1994 13210-1994 Revision