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IEEE/IEC 62527-2007

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IEC 62527 Ed. 1 (IEEE Std 1450.2(TM)-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

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New IEEE Standard - Active. This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels. STIL language constructs are defined to specify the DC conditions necessary to execute digital vectors on automated test equipment (ATE). STIL language extensions include structures for: (a) specifying the DC conditions for a device under test; (b) specifying DC conditions either globally, by pattern burst, by pattern, or by vector; (c) specifying alternate DC levels; and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 62527
Publication Date Dec. 9, 2007
Language en - English
Page Count 44
Revision Level
Supercedes
Committee Test Technology
Publish Date Document Id Type View
Dec. 9, 2007 62527-2007 Revision