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IEEE/IEC 62243-2002

Historical Revision

IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)

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New IEEE Standard - Superseded. AI-ESTATE is a set of specifications for data interchange and for standard services for the test and diagnostic environment. The purpose of AI-ESTATE is to standardize interfaces between functional elements of an intelligent diagnostic reasoner and representations of diagnostic knowledge and data for use by such diagnostic reasoners. Formal information models are defined to form the basis for a format to facilitate exchange of persistent diagnostic information between two reasoners, and also to provide a formal typing system for diagnostic services. This standard then defines the services to manipulate diagnostic information and to control a diagnostic reasoner.
The AI-ESTATE standard defines formal specifications for supporting system diagnosis. These specifications support the exchange and processing of diagnostic information and the control of diagnostic processes. Diagnostic processes include, but are not limited to, testability analysis, diagnosability assessment, diagnostic reasoning, maintenance support, and diagnostic maturation.
The AI-ESTATE standard provides formal models of diagnostic information to ensure unambiguous access to an understanding of the information supporting system testing and diagnosis. The standard defines formal information models and software services specific to several different types of diagnostic reasoners. The purpose is to provide semantically sound definitions of diagnostic knowledge and to specify software exchange and service interfaces that are consistent with the state of the practice in modern test and diagnostic systems (e.g., the use of eXtensible Markup Language [XML] and web services).

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 62243
Publication Date Nov. 20, 2002
Language en - English
Page Count 128
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
Publish Date Document Id Type View
July 16, 2012 62243-2010 Revision
Nov. 20, 2002 62243-2002 Revision