Logo

IEEE C62.36-1991

Historical Revision

IEEE Standard Test Methods for Surge Protectors and Protective Circuits Used in Information and Communications Technology (ICT) Circuits, and Smart Grid Data Circuits

$78.00


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


Stay effortlessly up-to-date with the latest standard revisions. When new versions are released, they're automatically charged and delivered to you, ensuring seamless compliance.

Document Preview Not Available...

New IEEE Standard - Superseded. Superseded by C62.36-1994. Methods for testing and measuring the characteristics of surge protectors used in low voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms or 1200 V dc are established. The surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements. Tests are included for characterizing standby performance, surge-limiting capabilities, and surge lifetime. Packaged single gas-tube, air-gap, varistor, or avalanche junction surge-protective devices are not covered, nor are test methods for low-voltage power circuit applications.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number C62.36
Publication Date Feb. 10, 1992
Language en - English
Page Count 36
Revision Level
Supercedes
Committee Surge Protective Devices/Low Voltage
Publish Date Document Id Type View
Nov. 2, 2016 C62.36-2016 Revision
July 9, 2014 C62.36-2014 Revision
Oct. 13, 2000 C62.36-2000 Revision
March 31, 1995 C62.36-1994 Revision
Feb. 10, 1992 C62.36-1991 Revision