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IEEE C37.81-1989

Historical Revision

IEEE Guide for Seismic Qualification of Class 1E Metal-Enclosed Power Switchgear Assemblies

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New IEEE Standard - Superseded. This standard provides specific requirements and guidance for seismic qualification of metal-enclosed power switchgear assemblies. This guide may also be used in other applications in which seismic response of metal-enclosed power switchgear assemblies is a consideration.
This guide may be used by equipment manufacturers to establish procedures that will yield data to substantiate performance claims or by equipment users to evaluate and verify performance of representative devices and assemblies as part of an overall qualification effort. As used in this guide, the word switchgear shall mean metal-enclosed power switchgear assemblies with the requirements as defined in ANSI/IEEE C37.20.1-1987, Standard for Metal-Enclosed Low-Voltage Power Circuit Breaker Switchgear [4], ANSI/IEEE C37.20.2-1987, Standard for Metal-Clad and Station-Type Cubicle Switchgear [5], and ANSI/IEEE C37.20.3-1987, Standard for Metal-Enclosed Interrupter Switchgear [6]. By definition, metal-enclosed power switchgear assemblies include metal-clad switchgear, station-type cubicle switchgear, metalenclosed interrupter switchgear, and low-voltage power circuit breaker switchgear. This guide does not cover metalenclosed bus or control switchboards. Metal-enclosed power switchgear assemblies fall into the category of complex devices as described in ANSI/IEEE Std 344-1987 [10]. Therefore, basic seismic qualification is dependent on test data. Switchgear assemblies have many different types and arrangements of devices and components. It is neither practical nor necessary to test each unique configuration of devices and components, nor is it necessary to test a given configuration for every possible seismic environment. However, it is essential that each switchgear assembly used in Class 1E applications be seismically qualified for its environment, and this qualification must be based on data obtained by test. Analysis may be used in data reduction, reconciling response spectra, and evaluation of changes.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number C37.81
Publication Date Jan. 30, 1990
Language en - English
Page Count 125
Revision Level
Supercedes
Committee Switchgear
Publish Date Document Id Type View
June 19, 2017 C37.81-2017 Revision
Jan. 30, 1990 C37.81-1989 Revision