Revision Standard - Active.
Information that is useful in constructing test sites used to perform radiated emission measurements in the frequency range of 30 MHz to 18 GHz is provided. Final validity of a test site can only be determined by performing normalized site attenuation and/or site voltage standing-wave ratio measurements as described in ANSI C63.4.
This guide provides information on construction of radiated emission test facilities in the frequency range of 30 MHz to 40 GHz. Standardized site validation methods above 18 GHz remain unavailable at present, however the changes in this edition are considered appropriate guidance for use up to 40 GHz. In general, the construction techniques described apply either below 1 GHz, or for 1 GHz and above. This guide does not address construction code compliance issues. Parties responsible for the design and construction of test sites are advised to consult with the various authorities having jurisdiction (AHJ) to determine the building, HVAC, plumbing, electrical, etc., codes and regulations that are applicable for the test site. In addition, beyond the similarity of basic principles, this guide also does not specifically address considerations on construction of test sites used for calibration of antennas used in EMC radiated emissions measurements; that topic is covered in ANSI C63.5.1,2 In addition, site-dependent measurement instrumentation and signal cabling issues are not in the scope of this guide.
To account for the frequency ranges and differing measurement needs as described in 1.1, this document provides construction guidance focused on two applications: a) At 1 GHz and below, the test site can be either an open-area test site (OATS) or a semi-anechoic chamber (SAC); b) At 1 GHz and above, the test site can be an OATS with absorber material on a portion of the ground plane, a SAC with absorber on a portion of the ground plane, or a SAC with absorbers on all conductive surfaces; the latter test site is called a fully anechoic room (FAR).
Common construction techniques are also described that apply for all the above test facilities.
SDO | IEEE: Institute of Electrical and Electronics Engineers |
Document Number | C63.7 |
Publication Date | March 9, 2015 |
Language | en - English |
Page Count | 50 |
Revision Level | |
Supercedes | |
Committee |