Revision Standard - Superseded.
Electromagnetic compatibility techniques and requirements for instruments measuring quasipeak, peak, rms, and average values for electrical and electronic equipment for various applications are provided.
This standard delineates the requirements of electromagnetic noise instrumentation for the frequency range of 10 kHz to 40 GHz incorporating quasi-peak, peak, rms and average detectors. NOTE: Examples of the types of voltages, currents, and fields to be measured are unmodulated and modulated sine waves, and components of electric and electromagnetic disturbances, including transients which may interfere with the operation of communication, electric, or electronic equipment. The basic instrument is a frequency-selective voltmeter. With appropriate coupling devices, such as antennas and current probes, the instrumentation will also measure other physical quantities such as field strength and current. The parameters for the quasi-peak detector are specified to agree with the requirements of the "Comite International Special des Perturbations Radioelectriques" (International Special Committee on Radio Interference) (CISPR). An optional discharge time constant is specified also. The requirements of this specification should not be construed to imply that one instrument is to cover the entire frequency range or that the instrument is permitted to have only the specified detector or detectors. Many users have measurement requirements over a smaller frequency range or may require additional detection capabilities. Although spectrum analyzers are frequently used in electromagnetic-noise measurements, it is not the purpose of this standard to cover such instruments. A separate document covering spectrum analyzers for use from 20 Hz to 40 GHz is in preparation as a proposed amendment to C63.2.
SDO | IEEE: Institute of Electrical and Electronics Engineers |
Document Number | C63.2 |
Publication Date | Feb. 29, 1988 |
Language | en - English |
Page Count | 24 |
Revision Level | |
Supercedes | |
Committee |