Revision Standard - Inactive-Withdrawn.
A language useful for describing Automatic Test Equipment (ATE) instrumentation and configurations, as well as Interface Test Adapters (ITA), is defined. Principally intended for testing environments using the ATLAS test language, TEDL can also be used to describe instrumentation in non-ATLAS environments.
This project will develop a standard to define a high order language used to describe the capabilities, configuration and control of test equipment. This standard is intended to apply principally to ATE system applications using Atlas test programs but it may also apply to ATE system applications using non-atlas test programs.
The trial-use standard has been implemented by vendors. Further development was required to widen its use in the ATE community to generate a full-use standard. This PAR replaces the earler time-expired PAR for this project.
SDO | IEEE: Institute of Electrical and Electronics Engineers |
Document Number | 993 |
Publication Date | June 19, 1997 |
Language | en - English |
Page Count | 71 |
Revision Level | |
Supercedes | |
Committee | SCC20 - Test and Diagnosis for Electronic Systems |