New IEEE Standard - Superseded.
1.2.1 This Test Procedure applies only to impulse tests on insulated conductors. 1.2.2 This Test Procedure is not intended to replace any existing or future standards covering impulse generators, impulse testing or voltage measurements. It is intended to supplement such Standards by indicating specific procedures for a specific type of system component.
1.1.1 This Test Procedure is intended as a guide for impulse testing of insulated conductors.
1.1.2 It is intended only for use as a design or development test, and not as a routine production or specification test.
1.1.3 Special needs may require deviations from this Test Procedure. A uniform procedure, however, is desirable in most cases.
SDO | IEEE: Institute of Electrical and Electronics Engineers |
Document Number | 82 |
Publication Date | Nov. 20, 1963 |
Language | en - English |
Page Count | 10 |
Revision Level | |
Supercedes | |
Committee | Insulated Conductors |