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IEEE 775-1993

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IEEE Guide for Designing Multistress Aging Tests of Electrical Insulation in a Radiation Environment

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New IEEE Standard - Inactive-Withdrawn. Guidelines for evaluating electrical insulation materials that are subjected to more than one significant aging stress are provided. The focus is on materials or equipment intended for use in nuclear facilities, such as power stations, where thermal, moisture, and radiation stresses frequently are of importance. Factors to consider in accelerated aging programs are identified. Only the design of tests is addressed. Specific procedures are not prescribed.
This guide identifies factors that should be considered in accelerated aging programs and is intended to be supportive of the aging requirements called for in IEEE Std 323-1983 and its subsidiary standards. This guide presents methodologies for conducting accelerated aging tests in which factors of synergistic interactions, radiation dose-rate effects, oxygen diffusion rates, etc., need to be considered. This guide does not define specific requirements for appropriate radiation exposure sources, selection of specific levels of thermal or radiation exposure, or specific properties to be monitored; nor does it make recommendations for sequencing or combining aging stresses for particular materials or circumstances. For such guidance, one should employ the general guidelines herein, supplemented by considerations of the specific equipment and environment, together with prior experience or the experience of others who have published data on the aging of materials closely related to those in question.
The purpose of this document is to provide guidelines for the evaluation of electrical insulation materials that are subjected to more than one significant aging stress. The focus of this guide is on materials or equipment that are intended for use in nuclear facilities, such as power stations, where thermal, moisture, and radiation stresses frequently are of importance. This guide is intended to help in the designing of aging tests; however, it does not prescribe any specific test procedures.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 775
Publication Date Oct. 11, 1993
Language en - English
Page Count 19
Revision Level
Supercedes
Committee Radiation Effects
Publish Date Document Id Type View
Oct. 11, 1993 775-1993 Revision