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IEEE 660-1986

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IEEE Standard for Semiconductor Memory Test Pattern Language

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New IEEE Standard - Inactive-Withdrawn.
The scope of this standard is the definition of a descriptive language, including vocabulary and grammar, to describe functional test sequences (also called patterns) for memory devices.
The purpose of this standard is to establish a common language for describing functional tests of memory devices. That language definition includes the vocabulary and grammar necessary to specify the functional testing of memory devices. The language is intended to be used as a general descriptive language rather than one for programming a tester. As a result, the grammar and syntax are defined in a looser and more general way than would be required for a programming language. Rigorous Backus-Naur Form (BNF) descriptions are not included.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 660
Publication Date Feb. 18, 1986
Language en - English
Page Count 14
Revision Level
Supercedes
Committee Test Technology
Publish Date Document Id Type View
Feb. 18, 1986 660-1986 Revision