New IEEE Standard - Superseded.
IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
This standard covers electrical tests and performance requirements for exposed semiconducting shields on premolded cable accessories, specifically joints and separable insulated connectors, rated 5 kV through 35 kV.
SDO | IEEE: Institute of Electrical and Electronics Engineers |
Document Number | 592 |
Publication Date | Nov. 29, 1977 |
Language | en - English |
Page Count | 10 |
Revision Level | |
Supercedes | |
Committee | Insulated Conductors |