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IEEE 301-1976

Historical Revision

IEEE Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors (For Ionizing Radiation)

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Revision Standard - Superseded. This standard provides standard test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation. It supersedes the previous edition, IEEE Std 301-1969 (ANSI N42.2-1969). The standard has been modified and refined based on the experience gained in using the earlier edition over a six-year period and taking into account advances in the technology. Improvements in preamplifier noise characteristics and pulse shaping techniques as well as increased utilization of integral detector-preamplifier assemblies have occurred in recent years.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 301
Publication Date Jan. 30, 1976
Language en - English
Page Count 30
Revision Level
Supercedes
Committee Nuclear Instruments and Detectors
Publish Date Document Id Type View
May 10, 1989 301-1988 Revision
Jan. 30, 1976 301-1976 Revision
Nov. 30, 1968 301-1969 Revision