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IEEE 301-1969

Historical Revision

IEEE Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors (For Ionizing Radiation)

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New IEEE Standard - Superseded. Semiconductor radiation detectors have come into widespread use in recent years for detection of ionizing radiation. Both silicon and germanium detectors have been developed with silicon finding its principal application in the detection and analysis of heavy charged particles. Germanium detectors with their relatively high atomic number (as compared with silicon) and with large sensitive volumes have come into widespread use in the detection and analysis of gamma radiation. The advent of semiconductor detectors has stimulated development of electronic instruments with characteristics that permit exploitation of their capabilities. This has made desirable standard test procedures so that measurements may have the same meaning to all manufacturers and users. This Test Procedure is not intended to imply that all tests described herein are mandatory, but only that such tests as are carried out should be performed in accordance with the procedures herein.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 301
Publication Date Nov. 30, 1968
Language en - English
Page Count 22
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
May 10, 1989 301-1988 Revision
Jan. 30, 1976 301-1976 Revision
Nov. 30, 1968 301-1969 Revision