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IEEE 218-1956

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IEEE Standard Methods of Testing Transistors

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New IEEE Standard - Inactive-Withdrawn.
This standard deals with the methods of measurement of important characteristics of transistors. In general, these characteristics are referred to as parameters of the devices. Because of the youthfulness of the transistor art, methods of testing transistors will continue to change considerably before the art can be considered to have "stabilized" sufficiently for complete standardization. This standard corresponds to the current state of transistor testing methods, and its publication by the IRE is considered preferable to waiting for a future stabilization of the many rapid changes now characteristic of this field

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 218
Publication Date Nov. 30, 1955
Language en - English
Page Count 22
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Nov. 30, 1955 218-1956 Revision