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IEEE 1671.4-2007

Historical Revision

IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration

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New IEEE Standard - Superseded. This document specifies an exchange format, utilizing XML, for identifying the test configuration used to test and diagnose a unit under test (UUT) on an automatic test system (ATS).
The scope of this trial-use standard is the definition of an exchange format, using eXtensible Markup Language (XML), for identifying all of the hardware, software, and documentation that may be used to test and diagnose a UUT on an automatic test system (ATS).
The test configuration provides a framework, which enables test program set data to be exchanged between compliant systems. The data supports the acquisition and itemization of test assets required to be in place prior to testing a UUT on the test system.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1671.4
Publication Date April 30, 2008
Language en - English
Page Count 35
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
Publish Date Document Id Type View
April 30, 2014 1671.4-2014 Revision
April 30, 2008 1671.4-2007 Revision