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IEEE 1671.3-2007

Historical Revision

IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description

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New IEEE Standard - Superseded. This document specifies an exchange format, using XML, for identifying all of the hardware, software, and documentation associated with a unit under test (UUT). This UUT may be tested and diagnosed using a test program set (TPS) on an automatic test system (ATS).
The scope of this standard is the definition of an exchange format, using eXtensible Markup Language (XML), for information that uniquely describes a category or type of UUT. The format will include the ability to specify multiple manufacturers for each UUT, as cases may exist where a single UUT is supplied by a variety of manufacturers. This information is intended to support all aspects of the test and maintenance environment.
The purpose of this standard is to promote and facilitate interoperability between components of test and maintenance support systems by defining a common set of identification information for UUTs. The UUTDescription schema becomes a class of information that can be used within the ATML family of standards. This standard will allow a common UUT description to be transportable across a variety of test and maintenance environments, including but not limited to, the automotive, semiconductor, aerospace, and military industries.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1671.3
Publication Date March 28, 2008
Language en - English
Page Count 33
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
Publish Date Document Id Type View
April 13, 2018 1671.3-2017 Revision
March 28, 2008 1671.3-2007 Revision