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IEEE 1671.3-2017

Current Revision

IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description

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Revision Standard - Active. An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard.
This standard defines an exchange format, utilizing Extensible Markup Language (XML), for both the static description of a UUT and the specific description of UUT instance information.
No purpose statement is required since this standard is intended for IEC standardization.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1671.3
Publication Date April 13, 2018
Language en - English
Page Count 104
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
Publish Date Document Id Type View
April 13, 2018 1671.3-2017 Revision
March 28, 2008 1671.3-2007 Revision