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IEEE 1671-2006

Historical Revision

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

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New IEEE Standard - Superseded. This document specifies the framework for the family of ATML standards. ATML defines a standard exchange medium for sharing information between components of an Automatic Test System (ATS), utilizing the eXtensible Markup Language (XML).
ATML defines a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the eXtensible Markup Language (XML). This document specifies the framework for the family of ATML standards.
The purpose of ATML is to support test program, test asset, and Unit Under Test (UUT) interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this document is to provide an overview of ATML goals as well as to provide guidance for usage of the ATML family of standards.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1671
Publication Date Dec. 15, 2006
Language en - English
Page Count 89
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
Publish Date Document Id Type View
Jan. 20, 2011 1671-2010 Revision
Dec. 15, 2006 1671-2006 Revision