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IEEE 1671-2010

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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

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Revision Standard - Inactive-Reserved. This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.
ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.
The purpose of ATML is to support TP, test asset, and UUT interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this standard is to provide an overview of ATML goals, define the ATML family of standards, and specify common data elements for the ATML family of standards.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1671
Publication Date Jan. 20, 2011
Language en - English
Page Count 388
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
Publish Date Document Id Type View
Jan. 20, 2011 1671-2010 Revision
Dec. 15, 2006 1671-2006 Revision