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IEEE 1620.1-2006

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IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators

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New IEEE Standard - Inactive-Reserved. Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.
This is a full-use standard that specifies methods for the characterization of organic transistor-based ring oscillators. The methods are applicable to all ring oscillators fabricated from organic semiconductor materials and are independent of the fabrication process.
The purpose of this project is to develop a standard methodology to characterize organic transistor based-ring oscillators and to allow reporting of their performance and associated data.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1620.1
Publication Date Nov. 8, 2006
Language en - English
Page Count 16
Revision Level
Supercedes
Committee Microprocessor Standards Committee
Publish Date Document Id Type View
Nov. 8, 2006 1620.1-2006 Revision