New IEEE Standard - Inactive-Reserved.
An aid in the understanding and use of digital test interchange format (DTIF) files is provided in this guide. This information will be an aid to users in developing tools such as pre-processors and postprocessors of DTIF data and other utilities.
This project will develop an aid in the understanding and use of DTIF files.
The application guide will provide information that will be an aid to users in developing tools such as pre-processors and post-processors of DTIF data, and other utilities.
SDO | IEEE: Institute of Electrical and Electronics Engineers |
Document Number | 1546 |
Publication Date | March 23, 2001 |
Language | en - English |
Page Count | 38 |
Revision Level | |
Supercedes | |
Committee | SCC20 - Test and Diagnosis for Electronic Systems |