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IEEE 1545-1999

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IEEE Standard for Parametric Data Log Format

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New IEEE Standard - Inactive-Withdrawn. Jan 2005: Administratively withdrawn. A language and file format for describing parametric test data is defined. Data types, dataformats, and file formats are included.
This standard will define the file and record formats for parametric test data acquired during a test operation. This standard supports and is part of the IEEE 1226 family of standards.
The purpose of this standard is to provide a means to log parametric data so that the data can be exchanged for the purpose of analysis and historical trend reporting.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1545
Publication Date Nov. 15, 1999
Language en - English
Page Count 36
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
Publish Date Document Id Type View
Nov. 15, 1999 1545-1999 Revision