New IEEE Standard - Inactive-Withdrawn.
This standard was developed to provide standard, unambiguous definitions of testability diagnosability metrics and characteristics. It builds on fundamental definitions derived from elements in formal information models related to test and diagnosis defined in IEEE Std 1232-2002.
This standard defines technology independent testability and diagnosability characteristics and metrics, particularly those based on relevant standard information models including standard AI-ESTATE (IEEE 1232.1 and P1232.3) information models.
This standard will provide consistent, unambiguous definitions of testability and diagnosability characteristics and metrics. This will provide a common basis for system testability and diagnosability assessment.
SDO | IEEE: Institute of Electrical and Electronics Engineers |
Document Number | 1522 |
Publication Date | March 23, 2005 |
Language | en - English |
Page Count | 35 |
Revision Level | |
Supercedes | |
Committee | SCC20 - Test and Diagnosis for Electronic Systems |