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IEEE 1450.6.1-2009

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IEEE Standard for Describing On-Chip Scan Compression

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New IEEE Standard - Inactive-Reserved. This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.
This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for each step independent of on-chip scan compression logic used.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1450.6.1
Publication Date July 13, 2009
Language en - English
Page Count 56
Revision Level
Supercedes
Committee Test Technology
Publish Date Document Id Type View
July 13, 2009 1450.6.1-2009 Revision