New IEEE Standard - Superseded.
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defined the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe.
This standard will define the test program set data embodied in a number of ASCII files for stimulus, response, and diagnostics of digital systems for use on digital Automatic Test Systems.
This standard will develop a definition of digital test information for digital test systems to cover UUT Model, stimulus/response, fault dictionary, probe data, and other forms of data. Any existing defacto standards will be given precedence.
SDO | IEEE: Institute of Electrical and Electronics Engineers |
Document Number | 1445 |
Publication Date | March 10, 1999 |
Language | en - English |
Page Count | 108 |
Revision Level | |
Supercedes | |
Committee | SCC20 - Test and Diagnosis for Electronic Systems |