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IEEE 1445-1998

Historical Revision

IEEE Standard for Digital Test Interchange Format (DTIF)

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New IEEE Standard - Superseded. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defined the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe.
This standard will define the test program set data embodied in a number of ASCII files for stimulus, response, and diagnostics of digital systems for use on digital Automatic Test Systems.
This standard will develop a definition of digital test information for digital test systems to cover UUT Model, stimulus/response, fault dictionary, probe data, and other forms of data. Any existing defacto standards will be given precedence.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1445
Publication Date March 10, 1999
Language en - English
Page Count 108
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
Publish Date Document Id Type View
Jan. 27, 2017 1445-2016 Revision
March 10, 1999 1445-1998 Revision