Logo

IEEE 1160-1993

Current Revision

IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors

$165.00


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


Stay effortlessly up-to-date with the latest standard revisions. When new versions are released, they're automatically charged and delivered to you, ensuring seamless compliance.

Document Preview Not Available...

New IEEE Standard - Inactive-Reserved. This standard applies to the measurement of bulk properties of high-purity germanium as they relate to fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity center per cm3, usually on the order of 1010 cm-3.
This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3, usually on the order of 1010 cm-3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-19
The purpose of this standard is to establish uniform procedures for measurements and analyses in the determination and reporting of bulk properties relevant to germanium radiation detector fabrication and performance. These properties are net electrically active impurity concentrations, |NA - ND|, the concentration of isolated defects with deep electronic levels NT, and certain crystallographic properties. The techniques described herein are those that have found general use in the industry, are practical, and provide verifiable and desired information to the detector fabricator. As an aid to the reader, an annex is included for background material. Paragraph numbers in the annex are prefixed by the letter "A," while the numerical parts of the numbers correspond to those in the main body of the text to which they pertain. Not all tests described herein are mandatory; however, any tests that are intended to conform to this standard shall be performed according to its provisions. Mandatory procedures are designated by the word "shall." Recommended procedures are designated by the words "should" or "recommended." Optional procedures are designated by the word "may."

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1160
Publication Date May 25, 1993
Language en - English
Page Count 36
Revision Level
Supercedes
Committee Nuclear Instruments and Detectors
Publish Date Document Id Type View
May 25, 1993 1160-1993 Revision