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IEEE 1149.4-1999

Historical Revision

IEEE Standard for a Mixed-Signal Test Bus

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New IEEE Standard - Superseded. The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.
Interface system between mixed-signal electronic components, assemblies, and systems, and external or built-in-test equipment to provide those components, assemblies, and systems with testability attributes.
To define and describe the signals, functions, and characteristics of the testability bus and to describe how the bus shall be implemented to improve the controllability and observability of mixed-signal designs and to support mixed-signal built-in test structures in order to reduce test development time, testing costs, and improve test quality.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1149.4
Publication Date March 20, 2000
Language en - English
Page Count 84
Revision Level
Supercedes
Committee Test Technology
Publish Date Document Id Type View
March 18, 2011 1149.4-2010 Revision
March 20, 2000 1149.4-1999 Revision