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IEEE 1149.1-1990

Historical Revision

IEEE Standard for Test Access Port and Boundary-Scan Architecture

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Revision Standard - Superseded. Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1149.1
Publication Date May 21, 1990
Language en - English
Page Count 139
Revision Level
Supercedes
Committee Test Technology
Publish Date Document Id Type View
May 13, 2013 1149.1-2013 Revision
July 23, 2001 1149.1-2001 Revision
May 21, 1990 1149.1-1990 Revision