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IEEE 1149.1-2013

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IEEE Standard for Test Access Port and Boundary-Scan Architecture

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Revision Standard - Inactive-Reserved. Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that allows rigorous structural description of the component-specific aspects of such testability features, and a second language is defined that allows rigorous procedural description of how the testability features may be used.
This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: Testing the interconnections between integrated circuits once they have been assembled onto a printed circuit board or other substrate - Testing the integrated circuit itself - Observing or modifying circuit activity during the component's normal operation The test logic consists of a boundary-scan register and other building blocks and is accessed through a test access port (TAP).
This subclause provides a general overview of the operation of a component compatible with this standard and provides a background to the detailed discussion in later clauses. The circuitry defined by this standard allows test instructions (which take control of the component outputs and observe the component inputs) and associated test data to be fed into a component and, subsequently, allows the results of execution of such instructions to be read out. All information (instructions, test data, and test results) is communicated in a serial format

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1149.1
Publication Date May 13, 2013
Language en - English
Page Count 444
Revision Level
Supercedes
Committee Test Technology
Publish Date Document Id Type View
May 13, 2013 1149.1-2013 Revision
July 23, 2001 1149.1-2001 Revision
May 21, 1990 1149.1-1990 Revision