New IEEE Standard - Superseded.
This document interprets the single failure criterion, discusses failures, and presents an acceptable method of single failure analysis for Class IE systems
The purpose of this document is to interpret the single failure criterion and to provide guidance in its application. It is intended that invoking system standards which utilize the single failure criterion will result in application of this standard; however, it is not the function of this standard to identify those standards in order to determine where the single failure criterion is to be applied, or to force compliance of the single failure criterion on a system. It is the specific function of this document to interpret how the single failure criterion is to be applied to Class IE systems.
SDO | IEEE: Institute of Electrical and Electronics Engineers |
Document Number | 379 |
Publication Date | June 30, 1977 |
Language | en - English |
Page Count | 12 |
Revision Level | |
Supercedes | |
Committee |