BSI |
BS QC 790110 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits |
|
BSI |
BS EN 190110 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits |
|
BSI |
BS QC 790111 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories |
|
BSI |
BS QC 790202 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers |
|
BSI |
BS QC 790130 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU) |
|
BSI |
BS QC 790107 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. Integrated circuit dynamic read/write memories |
|
BSI |
BS QC 790131 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Complementary MOS digital integrated circuits (series 4000 B and 4000 UB) |
|
BSI |
BS QC 760101 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures |
|
BSI |
BS QC 790303 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC) |
|
BSI |
BS QC 790304 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC) |
|
BSI |
BS CECC 63101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits |
|
BSI |
BS QC 760201 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
|
BSI |
BS QC 790105 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories |
|
BSI |
BS CECC 90115 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits |
|
BSI |
BS CECC 90203 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits |
|
BSI |
BS QC 790109 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Family specification for HCMOS digital integrated circuits series 54/74 HC, 54/74 HCT, 54/74 HCU |
|
BSI |
BS CECC 90302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage comparators |
|
BSI |
BS QC 790101 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits |
|
BSI |
BS QC 720100 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices |
|
BSI |
BS QC 760100 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures |
|
BSI |
BS CECC 63201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits (capability approval) |
|
BSI |
BS QC 790132 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays) |
|
BSI |
BS QC 790104 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification. Complementary MOS digital integrated circuits, series 4000 B and 4000 UB |
|
BSI |
BS CECC 90202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
|
BSI |
BS EN 150001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose semiconductor diodes |
|
BSI |
BS CECC 90201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
|
BSI |
BS CECC 50000 |
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices |
|
BSI |
BS QC 760200 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
|
BSI |
BS CECC 90000 |
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
|
BSI |
BS EN 190000 |
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
|
BSI |
BS QC 790106 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. MOS ultraviolet light erasable electrically programmable read-only memories |
|
BSI |
BS EN 190100 |
Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits |
|
BSI |
BS CECC 90300 |
Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits |
|
BSI |
BS EN 190116 |
Harmonized system of quality assessment for electronic components. Family specification: AC MOS digital integrated circuits |
|
BSI |
BS CECC 90200 |
Harmonized system of quality assessment for electronic components: sectional specification: analogue monolithic integrated circuits |
|
BSI |
BS EN 113001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: camera tubes |
|
BSI |
BS EN 150011 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors |
|
BSI |
BS CECC 63100 |
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits |
|
BSI |
BS EN 150010 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient rated thyristors |
|
BSI |
BS CECC 50009 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
|
BSI |
BS EN 150009 |
Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
|
BSI |
BS CECC 46001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cold cathode indicator tubes |
|
BSI |
BS QC 750104 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications |
|
BSI |
BS EN 150008 |
Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
|
BSI |
BS CECC 50008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
|
BSI |
BS CECC 90301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers |
|
BSI |
BS QC 720104 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-FET modules with/without pigtail, for fibre optic systems or subsystems |
|
BSI |
BS EN 190109 |
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated HC MOS circuits series HC/HCT/HCU |
|
BSI |
BS CECC 90109 |
Specification for harmonized system of quality assessment for electronic components. Family specification. Digital integrated HC MOS circuits series HC/HCT/HCU |
|
BSI |
BS EN 147101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: relay sockets of assessed quality |
|
BSI |
BS EN 111001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes |
|
BSI |
BS QC 760000 |
Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification |
|
BSI |
BS CECC 63000 |
Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits |
|
BSI |
BS QC 750001 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes |
|
BSI |
BS EN 167101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS 166101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 133221 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 130301 |
Harmonized System of Quality Assessment for Electronic Components, Blank Detail Specif |
|
BSI |
BS EN 138101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 169201 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
|
BSI |
BS EN 111101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes |
|
BSI |
BS CECC 45004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: disc seal power tubes |
|
BSI |
BS QC 750103 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification |
|
BSI |
BS QC 720105 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-photodiodes with/without pigtail, for fibre optic systems or subsystems |
|
BSI |
BS QC 750114 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications |
|
BSI |
BS CECC 90112 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits |
|
BSI |
BS EN 112001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: image converter and image intensifier tubes |
|
BSI |
BS CECC 20000 |
Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices |
|
BSI |
BS EN 120000 |
Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices |
|
BSI |
BS EN 196103 |
Harmonized System of Quality Assessment for Electronic Components - Blank Detail Speci |
|
BSI |
BS CECC 90111 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits |
|
BSI |
BS QC 750107 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications |
|
BSI |
BS CECC 90105 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fusible link programmable bipolar read only memories, silicon monolithic integrated circuits |
|
BSI |
BS QC 750106 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications |
|
BSI |
BS QC 790100 |
Harmonized System of Quality Assessment for Electric Components. Semiconductor Devices |
|
BSI |
BS EN 168201 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal units. (Qualification approval) |
|
BSI |
BS CECC 90104 |
Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB |
|
BSI |
BS CECC 75201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim example. Detail specification/blank detail specification. Circular connectors for frequencies below 3 MHz |
|
BSI |
BS EN 120002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: infrared emitting diodes, infrared emitting diode arrays |
|
BSI |
BS CECC 40301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed precision resistors |
|
BSI |
BS EN 160201 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Microwave modular electronic units of assessed quality. Capability approval |
|
BSI |
BS EN 190107 |
Specification for harmonized system of quality assessment for electronic components. Family specification. TTL FAST digital integrated circuits series 54 F, 74 F |
|
BSI |
BS CECC 96200 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: lever switches |
|
BSI |
BS EN 114001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes |
|
BSI |
BS CECC 42201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Surge suppression varistors |
|
BSI |
BS CECC 96100 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: rotary switches |
|
BSI |
BS QC 750108 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A |
|
BSI |
BS EN 180101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed fibre optic attenuators |
|
BSI |
BS QC 750102 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification |
|
BSI |
BS CECC 63200 |
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits (capability approval) |
|
BSI |
BS EN 122002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connectors |
|
BSI |
BS EN 190101 |
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84 |
|
BSI |
BS CECC 90101 |
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits, series 54, 64, 74, 84 |
|
BSI |
BS CECC 96300 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: sensitive switches |
|
BSI |
BS EN 129101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: wirewound surface mounting inductors of assessed quality. Assessment level E |
|
BSI |
BS CECC 90114 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA) |
|
BSI |
BS QC 750112 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz |
|
BSI |
BS EN 129102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirewound surface mounting inductors of assessed quality. Assessment level P |
|
BSI |
BS EN 144002 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144003 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144004 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 144001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30801 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS EN 132401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30901 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30701 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 64101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 64201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31701 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30202 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30601 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 18001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 25401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30501 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 30302 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31501 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40202 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 31801 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS QC 300301 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 32201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 35001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40101 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40103 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 12001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 14001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40203 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 13001 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40104 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 40102 |
Specification for Harmonized System of Quality Assessment for Electronic Components. B |
|
BSI |
BS CECC 41202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level M) |
|
BSI |
BS EN 140202 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level M) |
|
BSI |
BS EN 175200 |
Harmonized system of quality assessment for electronic components. Sectional specification: circular connectors |
|
BSI |
BS QC 750111 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A |
|
BSI |
BS CECC 96400 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: push-button switches |
|
BSI |
BS QC 720106 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for avalanche photodiodes (APDs) with/without pigtail, for fibre optic systems or subsystems |
|
BSI |
BS EN 168101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval) |
|
BSI |
BS CECC 68101 |
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: QUARTZ CRYSTAL UNITS (CAPABILITY APPROVAL) |
|
BSI |
BS QC 750110 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A |
|
BSI |
BS CECC 41201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level S) |
|
BSI |
BS CECC 22121 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connectors, series BNC |
|
BSI |
BS EN 122001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency connectors (Type MIL-C-39012) |
|
BSI |
BS EN 123300-800 |
Specification for Harmonized System of Quality Assessment for Electronic Components. C |
|
BSI |
BS QC 301201 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS QC 300401 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS CECC 23300-003-91 |
Specification for Harmonized System of Quality Assessment for Electronic Components. C |
|
BSI |
BS CECC 31601 |
Specification for Harmonized System of Quality Assessment for Electronic Components. F |
|
BSI |
BS EN 140201 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level S) |
|
BSI |
BS EN 140203 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level H) |
|
BSI |
BS CECC 41102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level M) |
|
BSI |
BS EN 167100 |
Harmonized System of Quality Assessment for Electronic Components. Section Specificati |
|
BSI |
BS EN 150013 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: current regulator and current reference diodes |
|
BSI |
BS EN 186002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category II |
|
BSI |
BS EN 186004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category IV |
|
BSI |
BS EN 129201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirewound inductors with ceramic or ferrite core. Assessment level E |
|
BSI |
BS CECC 40302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed precision resistors (Assessment level F) |
|
BSI |
BS EN 186001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connectors for optical fibres and cables. Environmental category I |
|
BSI |
BS EN 186003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category III |
|
BSI |
BS CECC 00017 |
Harmonized System of Quality Assessment for Electronic Components. Basic Specification |
|
BSI |
BS CECC 00013 |
Harmonized System of Quality Assessment for Electronic Components: Basic Specification |
|
BSI |
BS CECC 00012 |
Harmonized System of Quality Assessment for Electronic Components: Basic Specification |
|
BSI |
BS EN 129202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: wirebound inductors with ceramic or ferrite core. Assessment level P |
|
BSI |
BS EN 134102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: multi turn concentric capacitors (qualification approval) |
|
BSI |
BS EN 150006 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Variable capacitance diode(s) |
|
BSI |
BS CECC 41101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level S) |
|
BSI |
BS EN 186005 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connector for optical fibres and cables. Environmental category V |
|
BSI |
BS EN 160101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: printed board assembly modular electronic units of assessed quality. Capability approval |
|
BSI |
BS EN 153000 |
Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval) |
|
BSI |
BS EN 196403 |
Harmonized systems of quality assessment for electronic components. Blank detail specification: push button switches. Assessment level Y |
|
BSI |
BS EN 136002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW magnetrons for RF heating or cooking applications |
|
BSI |
BS EN 150012 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors |
|
BSI |
BS QC 960301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for sensitive switches |
|
BSI |
BS CECC 17001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Mercury wetted make contact units for general application |
|
BSI |
BS EN 120006 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pin-photodiodes for fibre optic applications |
|
BSI |
BS CECC 22111 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connections, series SMA |
|
BSI |
BS QC 960101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for rotary switches |
|
BSI |
BS CECC 23300-003 |
Harmonized system of quality assessment for electronic components. Capability detail specification: multilayer printed boards |
|
BSI |
BS EN 190102 |
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL-SCHOTTKY circuits, series 54S, 64S, 74S, 84S |
|
BSI |
BS EN 140211 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors. Capability approval |
|
BSI |
BS CECC 30702 |
Specification for Harmonized System for Quality Assessment for Electronic Components. |
|
BSI |
BS CECC 23300-801 |
Harmonized system of quality assessment for electronic components. Capability detail specification: multi-layer printed boards |
|
BSI |
BS EN 190108 |
Specification for harmonized system of quality assessment for electronic components. Family specification. TTL advanced SCHOTTKY digital integrated circuits series 54 AS, 74 AS |
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BSI |
BS EN 120007 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Liquid crystal displays. Monochrome LCDs without electronic circuit |
|
BSI |
BS QC 750005 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes |
|
BSI |
BS EN 134104 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: compression type trimmer capacitors (qualification approval) |
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BSI |
BS CECC 75301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim Example. Detail specification/blank detail specification: rectangular connectors for frequencies below 3 MHz |
|
BSI |
BS EN 134103 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: vane type air dielectric capacitors (qualification approval) |
|
BSI |
BS QC 960401 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for pushbutton switches |
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BSI |
BS QC 400201 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed power resistors. Assessment level E |
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BSI |
BS QC 400202 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed power resistors. Assessment level F |
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BSI |
BS EN 150014 |
Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors |
|
BSI |
BS EN 100012 |
Harmonized system of quality assessment for electronic components. Basic specification. X-ray inspection of electronic components |
|
BSI |
BS EN 150004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications |
|
BSI |
BS EN 120003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays |
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BSI |
BS 9940-03.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed precision resistors. Assessment level E |
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BSI |
BS QC 400302 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed precision resistors. Assessment level F |
|
BSI |
BS EN 181000 |
Harmonized system of quality assessment for electronic components. Generic specification. Fibre optic branching devices |
|
BSI |
BS EN 120008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: light emitting diodes and infrared emitting diodes for fibre optic system or sub-system |
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BSI |
BS EN 120005 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Photodiodes, photodiode-arrays (not intended for fibre optic applications) |
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BSI |
BS EN 169101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal controlled oscillators (capability approval) |
|
BSI |
BS EN 120004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output |
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BSI |
BS EN 125100 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for inductor applications |
|
BSI |
BS EN 186006-1 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Connectors for optical fibres and cables for military use. Environmental category VI |
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BSI |
BS EN 116501 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing TELECOM relays of assessed quality |
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BSI |
BS EN 123000 |
Harmonized system of quality assessment for electronic components. Generic specification: printed boards |
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IEC |
IEC 60748-2-6 |
Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section Six: Blank detail specification for microprocessor integrated circuits |
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BSI |
BS QC 960201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for lever (toggle) switches |
|
BSI |
BS QC 960501 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical switches for use in electronic equipment. Blank detail specification for in-line package switches |
|
BSI |
BS EN 129000 |
Harmonized system of quality assessment for electronic components. Generic specification. Fixed RF wound inductors |
|
BSI |
BS EN 138100 |
Harmonized System of Quality Assessment for Electronic Components, Sectional Specifica |
|
BSI |
BS EN 132400 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 40100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS EN 186180 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 186170 |
Harmonized System of Quality Assessment for Electronic Components, Sectional Specifica |
|
BSI |
BS CECC 40200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS EN 186100 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 186210 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 169200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30600 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS EN 130800 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 31200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 30500 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 31300 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 31400 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 30700 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 64200 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS EN 196500 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS EN 187200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30100 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30300 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30800 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 30900 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 31100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS CECC 64100 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS EN 133200 |
Harmonized System of Quality Assessment for Electronic Components. Sectional Specifica |
|
BSI |
BS CECC 40400 |
Harmonized System of Quality Assessment for Electronic Components: Sectional Specifica |
|
BSI |
BS EN 150003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for low frequency amplification |
|
BSI |
BS QC 760001 |
Harmonized system of quality assessment for electronic components. Film and hybrid integrated circuits. Generic specification. Requirements for internal visual inspection |
|
BSI |
BS EN 150007 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for high frequency amplification |
|
BSI |
BS EN 136001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pulsed magnetrons (excluding frequency agile magnetrons) |
|
BSI |
BS EN 134101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single turn disc trimmer capacitors (qualification approval) |
|
BSI |
BS EN 131200 |
Harmonized System of Quality Assessment for Electronic Components - Sectional Specific |
|
BSI |
BS CECC 75101 |
Specification for harmonized system of quality assessment for electronic components. Example detail specification/blank detail specification. Two-part and edge socket connectors for printed board application |
|
BSI |
BS EN 187102 |
Harmonized System of Quality Assessment for Electronic Components. Family Specificatio |
|
BSI |
BS EN 187104 |
Harmonized System of Quality Assessment for Electronic Components, Family Specificatio |
|
BSI |
BS EN 150015 |
Harmonized system of quality assessment for electronic components. Blank detail specification: unidirectional transient overvoltage suppressor diodes |
|
BSI |
BS CECC 51001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: mercury wetted change-over contact units, magnetically biased |
|
BSI |
BS EN 181102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fibre optic branching devices. Type: wavelength selective transmission star |
|
BSI |
BS EN 140102 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (assessment level M) |
|
BSI |
BS EN 136000 |
Harmonized system of quality assessment for electronic components: generic specification: magnetrons |
|
BSI |
BS EN 123300 |
Specification for harmonized system of quality assessment for electronic components. Sectional specification. Multilayer printed boards |
|
BSI |
BS CECC 41401 |
Specification for harmonized system of quality assessment for electronic conponents. Blank detail specification: rotary precision potentiometers (assessment level S) |
|
BSI |
BS EN 167000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 143000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS QC 700000 |
Harmonized System of Quality Assessment for Electric Components. Generic Specification |
|
BSI |
BS CECC 51000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 119000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 42000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 144000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 30000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 64000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS CECC 52000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 19000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 133000 |
Harmonized System of Quality Assessment for Electronic Components, Generic Specificati |
|
BSI |
BS EN 130000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 18000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 168000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 196000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 171000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 12000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 116000-2 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS CECC 41000 |
Harmonized System of Quality Assessment for Electronic Components: Generic Specificati |
|
BSI |
BS EN 138000 |
Harmonized System of Quality Assessment for Electronic Components. Generic Specificati |
|
BSI |
BS EN 190103 |
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY, circuits, series 54LS, 64LS, 74LS, 84LS |
|
BSI |
BS CECC 90103 |
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS |
|
BSI |
BS EN 160000 |
Harmonized system of quality assessment for electronic components. Generic specification: modular electronic units |
|
BSI |
BS EN 129100 |
Harmonized system of quality assessment for electronic components. Sectional specification: wirewound surface mounting inductors |
|
BSI |
BS EN 140103 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Fixed low power non-wirewound resistors (Assessment level P) |
|
BSI |
BS EN 170101 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Waveguide type dielectric resonators. Capability approval |
|
BSI |
BS QC 410402 |
Specification for harmonized system of quality assessment for electronic components. Potentiometers for use in electronic equipment. Blank detail specification: rotary precision potentiometers. Assessment level E |
|
BSI |
BS EN 141101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Lead-screw actuated and rotary preset potentiometers |
|
BSI |
BS EN 116203 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing relays for enhanced industrial application |
|
BSI |
BS QC 301901 |
Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed multilayer ceramic chip capacitors. Assessment level E |
|
BSI |
BS QC 420101 |
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. VARISTORS FOR USE IN ELECTRONIC EQUIPMENT BLANK DETAIL SPECIFICATION SILICON CARBIDE SURGE SUPPRESSION VARISTORS ASSESSMENT LEVEL E |
|
BSI |
BS EN 181101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fibre optic branching devices. Type: non wavelength selective transmissive star |
|
BSI |
BS EN 111100 |
Harmonized system of quality assessment for electronic components: sectional specification: display storage tubes |
|
BSI |
BS EN 166101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: surface acoustic wave (SAW) filters. Capability approval |
|
BSI |
BS EN 131802 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed polypropylene film dielectric metal foil d.c. capacitors. Assessment level EZ |
|
BSI |
BS EN 190106 |
Specification for harmonized system of quality assessment for electronic components. Family specification. TTL advanced low power SCHOTTKY digital integrated circuits series 54 ALS, 74 ALS |
|
BSI |
BS CECC 31500 |
Harmonized System of Quality Assessment of Electronic Components. Sectional Specificat |
|
BSI |
BS EN 113000 |
Harmonized system of quality assessment for electronic components. Generic specification: camera tubes |
|
BSI |
BS EN 147100 |
Harmonized system of quality assessment for electronic components. Sectional specification: relay sockets of assessed quality |
|
BSI |
BS EN 129200 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed inductors with ceramic or ferrite core wound with copper wire for RF circuits |
|
BSI |
BS EN 125401 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Adjusters used with magnetic oxide (ferrite) cores for use in inductors and tuned transformers |
|
BSI |
BS 3934 |
Specification for dimensions of semiconductor devices and integrated electronic circuits |
|
BSI |
BS CECC 46000 |
Harmonized system of quality assessment for electronic components: generic specification: cold cathode indicator tubes |
|
BSI |
BS CECC 16101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing relays. Test schedule 3 |
|
BSI |
BS CECC 41302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low power single turn rotary potentiometers (assessment level M) |
|
BSI |
BS EN 120001 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor |
|
BSI |
BS CECC 90113 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS ultra-violet light erasable electrically programmable read only memories silicon monolithic circuits |
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