BSI |
BS QC 760200 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
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BSI |
BS QC 760100 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures |
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BSI |
BS QC 760201 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
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BSI |
BS QC 760101 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures |
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BSI |
BS CECC 63200 |
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits (capability approval) |
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BSI |
BS CECC 63201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits (capability approval) |
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IEC |
IEC 60748-22 |
Semiconductor devices - Integrated circuits - Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
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BSI |
BS CECC 63100 |
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits |
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BSI |
BS QC 790101 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits |
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IEC |
IEC 60748-21 |
Semiconductor devices - Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures |
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BSI |
BS QC 790110 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits |
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BSI |
BS QC 390100 |
Harmonized system of quality assessment for electronic components. Fixed film resistor networks for use in electronic equipment. Sectional specification for film resistor networks of assessed quality on the basis of the capability approval procedure |
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BSI |
BS CECC 63101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits |
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BSI |
BS CECC 63000 |
Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits |
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BSI |
BS QC 760000 |
Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification |
|
IEC |
IEC 60748-22-1 |
Semiconductor devices - Integrated circuits - Part 22-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
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BSI |
BS QC 790202 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers |
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BSI |
BS QC 720100 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices |
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BSI |
BS QC 790104 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification. Complementary MOS digital integrated circuits, series 4000 B and 4000 UB |
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IEC |
IEC 60748-21-1 |
Semiconductor devices - Integrated circuits - Part 21-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures |
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BSI |
BS QC 790109 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Family specification for HCMOS digital integrated circuits series 54/74 HC, 54/74 HCT, 54/74 HCU |
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BSI |
BS QC 790111 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories |
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BSI |
BS QC 790131 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Complementary MOS digital integrated circuits (series 4000 B and 4000 UB) |
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BSI |
BS QC 790130 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU) |
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BSI |
BS QC 760001 |
Harmonized system of quality assessment for electronic components. Film and hybrid integrated circuits. Generic specification. Requirements for internal visual inspection |
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BSI |
BS QC 790303 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC) |
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BSI |
BS QC 790304 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC) |
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BSI |
BS EN 160200-1 |
Harmonized system of quality assessment for electronic components. Sectional specification. Microwave modular electronic units of assessed quality. Capability approval procedure |
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BSI |
BS CECC 265001 |
Harmonized system of quality assessment for electronic components. Technology approval schedule. Film and hybrid integrated circuits |
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BSI |
BS EN 140210 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed power resistors. Capability approval |
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BSI |
BS CECC 90200 |
Harmonized system of quality assessment for electronic components: sectional specification: analogue monolithic integrated circuits |
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BSI |
BS EN 190100 |
Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits |
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BSI |
BS QC 790107 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. Integrated circuit dynamic read/write memories |
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BSI |
BS EN 153000 |
Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval) |
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BSI |
BS CECC 90300 |
Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits |
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BSI |
BS EN 160100 |
Harmonized system of quality assessment for electronic components. Sectional specification: capability approval of manufacturers of printed board assemblies of assessed quality |
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BSI |
BS EN 168100 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval) |
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BSI |
BS CECC 68100 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval) |
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BSI |
BS QC 790105 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories |
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BSI |
BS EN 190110 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits |
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BSI |
BS EN 175500 |
Harmonized system of quality assessment for electronic components. Sectional specification:cable outlet accessories for connectors, including qualification approval and capability approval |
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BSI |
BS CECC 20000 |
Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices |
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BSI |
BS EN 120000 |
Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices |
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BSI |
BS CECC 50000 |
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices |
|
BSI |
BS EN 140211 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors. Capability approval |
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BSI |
BS EN 190116 |
Harmonized system of quality assessment for electronic components. Family specification: AC MOS digital integrated circuits |
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BSI |
BS CECC 90104 |
Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB |
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BSI |
BS CECC 90000 |
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
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BSI |
BS EN 190000 |
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
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BSI |
BS CECC 90203 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits |
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BSI |
BS EN 169100 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval) |
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BSI |
BS EN 134100 |
Harmonized system of quality assessment for electronic components. Sectional specification: variable capacitors (Qualification approval) |
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BSI |
BS EN 175200 |
Harmonized system of quality assessment for electronic components. Sectional specification: circular connectors |
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BSI |
BS EN 122003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification for the preparation of customer detail specifications (CDS) and detail specifications for standard production items with capability approval |
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BSI |
BS CECC 90115 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits |
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BSI |
BS CECC 90109 |
Specification for harmonized system of quality assessment for electronic components. Family specification. Digital integrated HC MOS circuits series HC/HCT/HCU |
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BSI |
BS EN 190109 |
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated HC MOS circuits series HC/HCT/HCU |
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BSI |
BS EN 160101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: printed board assembly modular electronic units of assessed quality. Capability approval |
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BSI |
BS EN 168101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval) |
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BSI |
BS CECC 68101 |
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: QUARTZ CRYSTAL UNITS (CAPABILITY APPROVAL) |
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BSI |
BS EN 134000 |
Harmonized system of quality assessment for electronic components. Generic specification: variable capacitors. (Qualification approval and capability approval) |
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BSI |
BS EN 190107 |
Specification for harmonized system of quality assessment for electronic components. Family specification. TTL FAST digital integrated circuits series 54 F, 74 F |
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BSI |
BS EN 168200 |
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval) |
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BSI |
BS QC 790106 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. MOS ultraviolet light erasable electrically programmable read-only memories |
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BSI |
BS EN 125100 |
Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for inductor applications |
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BSI |
BS CECC 90101 |
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits, series 54, 64, 74, 84 |
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BSI |
BS EN 190101 |
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84 |
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BSI |
BS QC 790132 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays) |
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