BSI |
BS QC 750113 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 A |
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BSI |
BS QC 750110 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A |
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BSI |
BS QC 750109 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A |
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BSI |
BS EN 150010 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient rated thyristors |
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BSI |
BS EN 150011 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors |
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BSI |
BS CECC 50008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
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BSI |
BS EN 150008 |
Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
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BSI |
BS QC 750111 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A |
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BSI |
BS CECC 50009 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
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BSI |
BS EN 150009 |
Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
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BSI |
BS EN 150013 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: current regulator and current reference diodes |
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BSI |
BS EN 150014 |
Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors |
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BSI |
BS EN 150003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for low frequency amplification |
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BSI |
BS EN 150007 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for high frequency amplification |
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BSI |
BS EN 111001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes |
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BSI |
BS CECC 90301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers |
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BSI |
BS QC 750108 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A |
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BSI |
BS CECC 40301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed precision resistors |
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BSI |
BS EN 140203 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level H) |
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BSI |
BS EN 140201 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level S) |
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BSI |
BS EN 140202 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level M) |
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BSI |
BS EN 120004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output |
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BSI |
BS EN 147101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: relay sockets of assessed quality |
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BSI |
BS EN 150012 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors |
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BSI |
BS CECC 42201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Surge suppression varistors |
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BSI |
BS CECC 40302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed precision resistors (Assessment level F) |
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BSI |
BS EN 113001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: camera tubes |
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BSI |
BS CECC 90201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
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BSI |
BS CECC 46001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cold cathode indicator tubes |
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BSI |
BS CECC 90302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage comparators |
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BSI |
BS CECC 90202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
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BSI |
BS EN 140211 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors. Capability approval |
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BSI |
BS EN 150004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications |
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BSI |
BS CECC 41201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level S) |
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BSI |
BS CECC 41202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level M) |
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BSI |
BS QC 400201 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed power resistors. Assessment level E |
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BSI |
BS QC 400202 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed power resistors. Assessment level F |
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BSI |
BS EN 111101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes |
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BSI |
BS EN 112001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: image converter and image intensifier tubes |
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BSI |
BS EN 120003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays |
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BSI |
BS CECC 63101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits |
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BSI |
BS EN 134104 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: compression type trimmer capacitors (qualification approval) |
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BSI |
BS EN 140103 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Fixed low power non-wirewound resistors (Assessment level P) |
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BSI |
BS EN 140104 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (Assessment levels SB and SC) |
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BSI |
BS CECC 45004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: disc seal power tubes |
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BSI |
BS EN 180101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed fibre optic attenuators |
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BSI |
BS CECC 41101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level S) |
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BSI |
BS EN 150006 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Variable capacitance diode(s) |
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BSI |
BS EN 120002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: infrared emitting diodes, infrared emitting diode arrays |
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BSI |
BS EN 122002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connectors |
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BSI |
BS 9940-03.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed precision resistors. Assessment level E |
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BSI |
BS EN 134101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single turn disc trimmer capacitors (qualification approval) |
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BSI |
BS QC 400302 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed precision resistors. Assessment level F |
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BSI |
BS EN 140102 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (assessment level M) |
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BSI |
BS CECC 41102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level M) |
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BSI |
BS EN 136002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW magnetrons for RF heating or cooking applications |
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BSI |
BS CECC 96200 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: lever switches |
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BSI |
BS EN 114001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes |
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BSI |
BS 166101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 133221 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 167101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 130301 |
Harmonized System of Quality Assessment for Electronic Components, Blank Detail Specif |
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BSI |
BS EN 169201 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 138101 |
Harmonized System of Quality Assessment for Electronic Components. Blank Detail Specif |
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BSI |
BS EN 116501 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Electromechanical all-or-nothing TELECOM relays of assessed quality |
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BSI |
BS CECC 90203 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits |
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BSI |
BS EN 196103 |
Harmonized System of Quality Assessment for Electronic Components - Blank Detail Speci |
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BSI |
BS EN 143004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (rod type) |
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BSI |
BS QC 750114 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications |
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BSI |
BS QC 750102 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification |
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BSI |
BS EN 150001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose semiconductor diodes |
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BSI |
BS EN 134102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: multi turn concentric capacitors (qualification approval) |
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BSI |
BS EN 134103 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: vane type air dielectric capacitors (qualification approval) |
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BSI |
BS EN 141101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Lead-screw actuated and rotary preset potentiometers |
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BSI |
BS EN 170101 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Waveguide type dielectric resonators. Capability approval |
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BSI |
BS EN 140402 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power wire wound surface mounting (SMD) resistors |
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BSI |
BS EN 122001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency connectors (Type MIL-C-39012) |
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BSI |
BS QC 160101 |
Specification for harmonized system of quality assessment for electronic components. Electrical relays. Blank detail specification. Electromechanical all-or-nothing relays. Test schedules 1, 2 and 3 |
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BSI |
BS EN 143003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (disc type) |
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BSI |
BS QC 750103 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification |
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BSI |
BS QC 750106 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications |
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BSI |
BS CECC 90115 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits |
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BSI |
BS CECC 41301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low power single turn rotary potentiometers (assessment level S) |
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BSI |
BS EN 186001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Connectors for optical fibres and cables. Environmental category I |
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BSI |
BS CECC 96100 |
Harmonized system of quality assessment for electronic components. Sectional specification including blank detail specification: rotary switches |
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BSI |
BS EN 129101 |
Harmonized system of quality assessment for electronic components. Blank detail specification: wirewound surface mounting inductors of assessed quality. Assessment level E |
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BSI |
BS CECC 41302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low power single turn rotary potentiometers (assessment level M) |
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BSI |
BS EN 120001 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor |
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BSI |
BS QC 750107 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications |
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BSI |
BS EN 131701 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric. Assessment level E |
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