BSI |
BS QC 750106 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications |
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BSI |
BS QC 750114 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications |
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BSI |
BS QC 750107 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications |
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BSI |
BS QC 750103 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification |
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BSI |
BS QC 750104 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications |
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BSI |
BS QC 750112 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz |
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BSI |
BS QC 750102 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification |
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BSI |
BS EN 150012 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors |
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BSI |
BS QC 750111 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A |
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BSI |
BS QC 750110 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A |
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BSI |
BS EN 150003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for low frequency amplification |
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BSI |
BS EN 150007 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for high frequency amplification |
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BSI |
BS QC 750108 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A |
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BSI |
BS EN 150011 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors |
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BSI |
BS CECC 50000 |
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices |
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BSI |
BS QC 790202 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers |
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BSI |
BS EN 153000 |
Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval) |
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BSI |
BS EN 150004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications |
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BSI |
BS CECC 50009 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
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BSI |
BS EN 150009 |
Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes |
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BSI |
BS CECC 45004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: disc seal power tubes |
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BSI |
BS EN 150010 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient rated thyristors |
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BSI |
BS EN 140211 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors. Capability approval |
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BSI |
BS EN 140203 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level H) |
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BSI |
BS EN 140201 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level S) |
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BSI |
BS QC 790110 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits |
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BSI |
BS EN 140202 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed power resistors (Assessment level M) |
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BSI |
BS EN 150001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose semiconductor diodes |
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BSI |
BS QC 750001 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes |
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BSI |
BS CECC 50008 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
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BSI |
BS EN 150008 |
Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes |
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BSI |
BS QC 790111 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories |
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BSI |
BS CECC 90202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
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BSI |
BS CECC 40301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed precision resistors |
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BSI |
BS QC 720100 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices |
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BSI |
BS QC 790130 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU) |
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BSI |
BS QC 760101 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures |
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BSI |
BS QC 400202 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed power resistors. Assessment level F |
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BSI |
BS QC 400201 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed power resistors. Assessment level E |
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BSI |
BS EN 120003 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays |
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BSI |
BS EN 135001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW power amplifier travelling wave tubes up to 500 watts |
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BSI |
BS QC 790107 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. Integrated circuit dynamic read/write memories |
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BSI |
BS QC 750005 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes |
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BSI |
BS EN 120004 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output |
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BSI |
BS 9925-03.01 |
Harmonized system of quality assessment for electronic components. Inductor and transformer cores for telecommunications. Blank detail specification: magnetic oxide cores for transformers and chokes for power applications. Assessment level A |
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BSI |
BS CECC 41201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level S) |
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BSI |
BS EN 111001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes |
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BSI |
BS CECC 41202 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: power potentiometers (assessment level M) |
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BSI |
BS QC 760201 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
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BSI |
BS CECC 40302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed precision resistors (Assessment level F) |
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BSI |
BS EN 120006 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pin-photodiodes for fibre optic applications |
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BSI |
BS QC 790303 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC) |
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BSI |
BS QC 790304 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC) |
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BSI |
BS EN 111101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes |
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BSI |
BS EN 140103 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Fixed low power non-wirewound resistors (Assessment level P) |
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BSI |
BS EN 113001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: camera tubes |
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BSI |
BS EN 134101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single turn disc trimmer capacitors (qualification approval) |
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BSI |
BS EN 140102 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (assessment level M) |
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BSI |
BS QC 790131 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Complementary MOS digital integrated circuits (series 4000 B and 4000 UB) |
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BSI |
BS EN 114001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes |
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BSI |
BS QC 720104 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-FET modules with/without pigtail, for fibre optic systems or subsystems |
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BSI |
BS QC 720105 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-photodiodes with/without pigtail, for fibre optic systems or subsystems |
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BSI |
BS EN 150014 |
Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors |
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BSI |
BS EN 136002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW magnetrons for RF heating or cooking applications |
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BSI |
BS EN 134104 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: compression type trimmer capacitors (qualification approval) |
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BSI |
BS EN 140200 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed power resistors |
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BSI |
BS CECC 46001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cold cathode indicator tubes |
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BSI |
BS CECC 42201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Surge suppression varistors |
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BSI |
BS CECC 90302 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage comparators |
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BSI |
BS EN 134103 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: vane type air dielectric capacitors (qualification approval) |
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BSI |
BS EN 140104 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power non-wirewound resistors (Assessment levels SB and SC) |
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BSI |
BS CECC 90201 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
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BSI |
BS EN 122002 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connectors |
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BSI |
BS CECC 75101 |
Specification for harmonized system of quality assessment for electronic components. Example detail specification/blank detail specification. Two-part and edge socket connectors for printed board application |
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BSI |
BS CECC 90301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers |
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BSI |
BS EN 147101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: relay sockets of assessed quality |
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BSI |
BS EN 134102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: multi turn concentric capacitors (qualification approval) |
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BSI |
BS EN 140402 |
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed low power wire wound surface mounting (SMD) resistors |
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BSI |
BS CECC 42101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low voltage varistors primarily for telephony applications (assessment level P) |
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BSI |
BS QC 720106 |
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for avalanche photodiodes (APDs) with/without pigtail, for fibre optic systems or subsystems |
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BSI |
BS EN 180101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed fibre optic attenuators |
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BSI |
BS EN 112001 |
Harmonized system of quality assessment for electronic components. Blank detail specification: image converter and image intensifier tubes |
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BSI |
BS CECC 22121 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency coaxial connectors, series BNC |
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BSI |
BS 9940-03.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed precision resistors. Assessment level E |
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BSI |
BS QC 400302 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed precision resistors. Assessment level F |
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BSI |
BS QC 400102 |
Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed low-power non-wirewound resistors. Assessment level F |
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BSI |
BS 9940-01.01 |
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification: fixed low power non-wirewound resistors. Assessment level E |
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BSI |
BS EN 140210 |
Harmonized system of quality assessment for electronic components. Sectional specification: fixed power resistors. Capability approval |
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BSI |
BS QC 790105 |
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories |
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BSI |
BS QC 750113 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 A |
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BSI |
BS EN 168201 |
Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal units. (Qualification approval) |
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BSI |
BS CECC 41101 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level S) |
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BSI |
BS EN 120000 |
Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices |
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BSI |
BS CECC 20000 |
Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices |
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BSI |
BS EN 122001 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: radio frequency connectors (Type MIL-C-39012) |
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BSI |
BS CECC 41102 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: preset potentiometers (assessment level M) |
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BSI |
BS CECC 41301 |
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low power single turn rotary potentiometers (assessment level S) |
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