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BSI BS IEC 63068-4:2022

Current Revision

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence.

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Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence.

SDO BSI: British Standards Institution
Document Number BS IEC 63068-4
Publication Date Sept. 7, 2022
Language en - English
Page Count 28
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Sept. 7, 2022 BS IEC 63068-4:2022 Revision