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BSI BS IEC 63003:2015

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Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505$uT$uM

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Standard for the common test interface pin map configuration

SDO BSI: British Standards Institution
Document Number BS IEC 63003
Publication Date Jan. 31, 2016
Language en - English
Page Count 174
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Jan. 31, 2016 BS IEC 63003:2015 Revision