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BSI BS IEC 62951-7:2019

Current Revision

Semiconductor devices. Flexible and stretchable semiconductor devices. Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor.

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Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor.

SDO BSI: British Standards Institution
Document Number BS IEC 62951-7
Publication Date March 6, 2019
Language en - English
Page Count 16
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
March 6, 2019 BS IEC 62951-7:2019 Revision