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BSI BS IEC 62899-503-3:2021

Current Revision

Printed electronics. Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method.

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Printed electronics. Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method.

SDO BSI: British Standards Institution
Document Number BS IEC 62899
Publication Date Sept. 8, 2021
Language en - English
Page Count 16
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Sept. 8, 2021 BS IEC 62899-503-3:2021 Revision