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BSI BS IEC 62860:2013

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Test methods for the characterization of organic transistors and materials

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Test methods for the characterization of organic transistors

SDO BSI: British Standards Institution
Document Number BS IEC 62860
Publication Date Aug. 31, 2014
Language en - English
Page Count 28
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Aug. 31, 2014 BS IEC 62860:2013 Revision