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BSI BS IEC 62047-44:2024

Current Revision

Semiconductor devices. Micro-electromechanical devices.Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices.

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Semiconductor devices. Micro-electromechanical devices.Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices.

SDO BSI: British Standards Institution
Document Number BS IEC 62047-44
Publication Date Feb. 29, 2024
Language en - English
Page Count
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Feb. 29, 2024 BS IEC 62047-44:2024 Revision