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BSI BS IEC 62047-43:2024

Current Revision

Semiconductor devices. Micro-electromechanical devices.Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices.

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Semiconductor devices. Micro-electromechanical devices.Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices.

SDO BSI: British Standards Institution
Document Number BS IEC 62047-43
Publication Date March 22, 2024
Language en - English
Page Count 22
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
March 22, 2024 BS IEC 62047-43:2024 Revision